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Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jun-Geol Baek | - |
| dc.date.accessioned | 2021-09-14T16:11:05Z | - |
| dc.date.available | 2021-09-14T16:11:05Z | - |
| dc.date.created | 2021-09-14 | - |
| dc.date.issued | 2021-07-14 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/126793 | - |
| dc.publisher | EURO | - |
| dc.title | Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps | - |
| dc.title.alternative | Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Jun-Geol Baek | - |
| dc.identifier.bibliographicCitation | 31st European Conference on Operational Research (EURO 2021) | - |
| dc.relation.isPartOf | 31st European Conference on Operational Research (EURO 2021) | - |
| dc.relation.isPartOf | EURO 2021 | - |
| dc.citation.title | 31st European Conference on Operational Research (EURO 2021) | - |
| dc.citation.conferencePlace | GR | - |
| dc.citation.conferencePlace | Athens, Greece | - |
| dc.citation.conferenceDate | 2021-07-11 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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