Design study of reflection time-of-flight mass spectrometer for EBIS charge breeder

Abstract

In this study, a time-of-flight mass spectrometer is developed to analyze the mass-to-charge ratio of ion beams generated from an electron beam ion source (EBIS) at the RAON heavy ion accelerator facility. The time-of-flight mass spectrometer comprises a Bradbury-Nielson gate, steerer, mirror electrode, and microchannel plate detector. The Bradbury-Nielson gate is applied to generate a bunch beam with a 5-ns pulse width at the front end of the time-of-flight system. A double-stage reflector is employed to obtain a beam chromatic correction from the energy spread of the ion beam generated from the EBIS. The design is created through optics simulation using the SIMION code, with Cs-133 as the reference ion. Consequently, the charge state of 27(+) separated from neighboring states at a maximum voltage of 20 kV is obtained. By utilizing ion sources of Cs1+ (m/z 133) and Rb1+ (m/z 85 and m/z 87) to perform the performance test on the designed TOFMS system, the spectral peak of the ion sources and a relatively high mass resolution are obtained. This paper introduces the development process and test results of the time-of-flight mass spectrometer in detail. (C) 2021 Elsevier B.V. All rights reserved.