Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Stable electrical performance of AlGaInP-based red micro-light emitting diode by controlling interfacial morphologies of metal contacts

Full metadata record
DC Field Value Language
dc.contributor.authorLee, Da-Hoon-
dc.contributor.authorSeong, Tae-Yeon-
dc.contributor.authorAmano, Hiroshi-
dc.date.accessioned2021-11-16T17:40:50Z-
dc.date.available2021-11-16T17:40:50Z-
dc.date.created2021-08-30-
dc.date.issued2021-08-15-
dc.identifier.issn0925-8388-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/127660-
dc.description.abstractThe stable electrical performance of micro-light-emitting diodes (micro-LEDs) is critical to display application. We investigated the effect of the interface morphologies of contacts to n-AlInP on the electrical stability of AlGaInP-based red micro-LEDs. Regardless of chip sizes (100 pm or 10 pm-size), micro-LEDs with Pd/Ge contacts gave lower and stable forward voltages than those with AuGe/Ni/Au contacts. When annealed at 450 ?C, the AuGe/Ni/Au contact underwent seriously inhomogeneous interfacial reactions, resulting in a large variation of interfacial morphologies across the whole contact/AlInP interface. However, the Pd/Ge contact exhibited similar morphologies across the whole interface when annealed. Further, when operated at 800 A/cm2, micro-LEDs with the Pd/Ge contacts underwent less electrical degradation than the ones with the AuGe/Ni/Au contacts. Based on the electrical and scanning transmission electron microscope (STEM) results, the unstable electrical behavior of red micro-LEDs with the AuGe/Ni/Au contact is discussed. ? 2021 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE SA-
dc.subjectOHMIC CONTACTS-
dc.titleStable electrical performance of AlGaInP-based red micro-light emitting diode by controlling interfacial morphologies of metal contacts-
dc.typeArticle-
dc.contributor.affiliatedAuthorSeong, Tae-Yeon-
dc.identifier.doi10.1016/j.jallcom.2021.159629-
dc.identifier.scopusid2-s2.0-85103595419-
dc.identifier.wosid000652811000004-
dc.identifier.bibliographicCitationJOURNAL OF ALLOYS AND COMPOUNDS, v.872-
dc.relation.isPartOfJOURNAL OF ALLOYS AND COMPOUNDS-
dc.citation.titleJOURNAL OF ALLOYS AND COMPOUNDS-
dc.citation.volume872-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.subject.keywordPlusOHMIC CONTACTS-
dc.subject.keywordAuthorAlGaInP-based red micro-LED-
dc.subject.keywordAuthorAuGe-
dc.subject.keywordAuthorNi-
dc.subject.keywordAuthorAu-
dc.subject.keywordAuthorPd-
dc.subject.keywordAuthorGe-
dc.subject.keywordAuthorUnstable electrical property-
dc.subject.keywordAuthorInterfacial morphology-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher SEONG, TAE YEON photo

SEONG, TAE YEON
공과대학 (신소재공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE