Growth and piezoelectric properties of amorphous and crystalline (K1-xNax)NbO(3-)based thin films
DC Field | Value | Language |
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dc.contributor.author | Woo, Jong-Un | - |
dc.contributor.author | Kim, Sun-Woo | - |
dc.contributor.author | Kim, Dae-Su | - |
dc.contributor.author | Kim, In-Su | - |
dc.contributor.author | Shin, Ho-Sung | - |
dc.contributor.author | Nahm, Sahn | - |
dc.date.accessioned | 2021-11-20T14:41:02Z | - |
dc.date.available | 2021-11-20T14:41:02Z | - |
dc.date.created | 2021-08-30 | - |
dc.date.issued | 2021-05 | - |
dc.identifier.issn | 1229-7801 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/128127 | - |
dc.description.abstract | (K1-xNax)NbO3 (KNN)-based piezoelectric thin films have been extensively studied for application in micro-electromechanical systems. However, growing homogenous crystalline (K1-xNax)NbO3 (CKNN) films with good piezoelectric properties is difficult because Na2O and K2O evaporate during the growth process at high temperatures. Recently, amorphous (K1-xNax)NbO3 (AKNN) films containing KNN nanocrystals with good piezoelectric properties have been fabricated at low temperatures. Furthermore, [001]-oriented crystalline (K1-xNax)NbO3 (OCKNN) films with excellent piezoelectric properties have been grown at low temperatures (<= 350 degrees C) using a metal-oxide nanosheet seed layer. This novel method is excellent for the growth of homogeneous KNN thin films. These films were deposited on a polymer substrate; thus, they can be utilized in future flexible electronic devices. In this study, the structural and piezoelectric properties of AKNN- and CKNN-based films fabricated at high temperatures, along with the growth process and application of OCKNN-based thin films at low temperatures, are reviewed. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | SPRINGER HEIDELBERG | - |
dc.title | Growth and piezoelectric properties of amorphous and crystalline (K1-xNax)NbO(3-)based thin films | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Nahm, Sahn | - |
dc.identifier.doi | 10.1007/s43207-021-00108-6 | - |
dc.identifier.scopusid | 2-s2.0-85102579211 | - |
dc.identifier.wosid | 000629911400003 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN CERAMIC SOCIETY, v.58, no.3, pp.249 - 268 | - |
dc.relation.isPartOf | JOURNAL OF THE KOREAN CERAMIC SOCIETY | - |
dc.citation.title | JOURNAL OF THE KOREAN CERAMIC SOCIETY | - |
dc.citation.volume | 58 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 249 | - |
dc.citation.endPage | 268 | - |
dc.type.rims | ART | - |
dc.type.docType | Review | - |
dc.identifier.kciid | ART002717372 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Ceramics | - |
dc.subject.keywordAuthor | K0.5Na0.5NbO3 | - |
dc.subject.keywordAuthor | Thin films | - |
dc.subject.keywordAuthor | Ferroelectrics | - |
dc.subject.keywordAuthor | Piezoelectrics | - |
dc.subject.keywordAuthor | Lead-free materials | - |
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