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Brass material analysis result with X-Ray fluorescence (XRF) system based on the Deep Learning method
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Wonho Lee | - |
| dc.date.accessioned | 2021-12-04T23:42:49Z | - |
| dc.date.available | 2021-12-04T23:42:49Z | - |
| dc.date.created | 2021-11-25 | - |
| dc.date.issued | 2021-10-20 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/129480 | - |
| dc.publisher | IEEE | - |
| dc.title | Brass material analysis result with X-Ray fluorescence (XRF) system based on the Deep Learning method | - |
| dc.title.alternative | Brass material analysis result with X-Ray fluorescence (XRF) system based on the Deep Learning method | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Wonho Lee | - |
| dc.identifier.bibliographicCitation | IEEE NSS-MIC-RTSD Conference | - |
| dc.relation.isPartOf | IEEE NSS-MIC-RTSD Conference | - |
| dc.relation.isPartOf | IEEE NSS-MIC-RTSD Conference | - |
| dc.citation.title | IEEE NSS-MIC-RTSD Conference | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.conferenceDate | 2021-10-16 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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