Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Depth Map Super-Resolution Using Guided Deformable Convolution

Full metadata record
DC Field Value Language
dc.contributor.authorKim, Joon-Yeon-
dc.contributor.authorJi, Seowon-
dc.contributor.authorBaek, Seung-Jin-
dc.contributor.authorJung, Seung-Won-
dc.contributor.authorKo, Sung-Jea-
dc.date.accessioned2021-12-07T11:41:15Z-
dc.date.available2021-12-07T11:41:15Z-
dc.date.created2021-08-30-
dc.date.issued2021-
dc.identifier.issn2169-3536-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/130075-
dc.description.abstractDepth maps acquired by low-cost sensors have low spatial resolution, which restricts their usefulness in many image processing and computer vision tasks. To increase the spatial resolution of the depth map, most state-of-the-art depth map super-resolution methods based on deep learning extract the features from a high-resolution guidance image and concatenate them with the features from the depth map. However, such simple concatenation can transfer unnecessary textures, known as texture copying artifacts, of the guidance image to the depth map. To address this problem, we propose a novel depth map super-resolution method using guided deformable convolution. Unlike standard deformable convolution, guided deformable convolution obtains 2D kernel offsets of the depth features from the guidance features. Because the guidance features are not explicitly concatenated with the depth features but are used only to determine the kernel offsets for the depth features, the proposed method can significantly alleviate the texture copying artifacts in the resultant depth map. Experimental results show that the proposed method outperforms the state-of-the-art methods in terms of qualitative and quantitative evaluations.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleDepth Map Super-Resolution Using Guided Deformable Convolution-
dc.typeArticle-
dc.contributor.affiliatedAuthorJung, Seung-Won-
dc.identifier.doi10.1109/ACCESS.2021.3076853-
dc.identifier.scopusid2-s2.0-85105101170-
dc.identifier.wosid000648332100001-
dc.identifier.bibliographicCitationIEEE ACCESS, v.9, pp.66626 - 66635-
dc.relation.isPartOfIEEE ACCESS-
dc.citation.titleIEEE ACCESS-
dc.citation.volume9-
dc.citation.startPage66626-
dc.citation.endPage66635-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryComputer Science, Information Systems-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.subject.keywordAuthorConvolution-
dc.subject.keywordAuthorFeature extraction-
dc.subject.keywordAuthorKernel-
dc.subject.keywordAuthorColor-
dc.subject.keywordAuthorSensors-
dc.subject.keywordAuthorImage color analysis-
dc.subject.keywordAuthorDecoding-
dc.subject.keywordAuthorConvolutional neural network-
dc.subject.keywordAuthordepth map-
dc.subject.keywordAuthorsuper-resolution-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Jung, Seung won photo

Jung, Seung won
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE