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Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements

Authors
Wang, HanShi, QuanXu, ZhihuoWei, MingKo, Hanseok
Issue Date
2019
Publisher
HINDAWI LTD
Citation
MATHEMATICAL PROBLEMS IN ENGINEERING, v.2019
Indexed
SCIE
SCOPUS
Journal Title
MATHEMATICAL PROBLEMS IN ENGINEERING
Volume
2019
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/131728
DOI
10.1155/2019/3651529
ISSN
1024-123X
Abstract
For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.
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공과대학 (전기전자공학부)
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