Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

IEC 62443 기반 스마트 제조 환경에서의 위협 분석 및 위험 평가에 관한 연구

Full metadata record
DC Field Value Language
dc.contributor.authorJin Jung Ha-
dc.date.accessioned2022-01-08T05:41:44Z-
dc.date.available2022-01-08T05:41:44Z-
dc.date.created2022-01-08-
dc.date.issued2021-11-18-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/134827-
dc.publisher한국통신학회-
dc.titleIEC 62443 기반 스마트 제조 환경에서의 위협 분석 및 위험 평가에 관한 연구-
dc.title.alternativeA Study on Threat Analysis and Risk Assessment in a Smart Manufacturing Environment Based on IEC 62443-
dc.typeConference-
dc.contributor.affiliatedAuthorJin Jung Ha-
dc.identifier.bibliographicCitation2021년도 한국통신학회 추계종합학술발표회, pp.821 - 822-
dc.relation.isPartOf2021년도 한국통신학회 추계종합학술발표회-
dc.relation.isPartOf2021년도 한국통신학회 추계종합학술발표회 논문집-
dc.citation.title2021년도 한국통신학회 추계종합학술발표회-
dc.citation.startPage821-
dc.citation.endPage822-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlace여수 디오션리조트-
dc.citation.conferenceDate2021-11-17-
dc.type.rimsCONF-
dc.description.journalClass2-
Files in This Item
There are no files associated with this item.
Appears in
Collections
ETC > 2. Conference Papers

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE