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Structural and piezoelectric properties of textured NLKNS-CZ thick films and their application in planar piezoactuator

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dc.contributor.authorChae, Seok-June-
dc.contributor.authorKim, Dae-Su-
dc.contributor.authorKim, Hero-
dc.contributor.authorGo, Su-Hwan-
dc.contributor.authorKim, Sun-Woo-
dc.contributor.authorKim, Eun-Ji-
dc.contributor.authorEum, Jae-Min-
dc.contributor.authorKim, In-Su-
dc.contributor.authorNahm, Sahn-
dc.date.accessioned2022-02-10T17:40:47Z-
dc.date.available2022-02-10T17:40:47Z-
dc.date.created2022-02-08-
dc.date.issued2022-02-
dc.identifier.issn0002-7820-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/135242-
dc.description.abstract0.97(Na0.5-xLixK0.5)(Nb0.89Sb0.11)O-3-0.03CaZrO(3) [(N0.5-xLxK)(NS)-CZ] piezoceramic (x = 0.325) has a pseudocubic-tetragonal-orthorhombic (PC-T-O) multi-structure. The PC structure formed in this piezoceramic was identified as the R3m rhombohedral structure. This piezoceramic showed the large piezoelectric charge constant (d(33)) of 515 pC/N due to the PC-T-O multi-structure. The NaNbO3 (NN) templates were used to texture the (N0.5-xLxK)(NS)-CZ thick films along the (001) direction, and the textured thick film (x = 0.0375) had a large Lotgering factor of 95.6%. The PC-T-O multi-structure was observed in this thick film (x = 0.0375), but the thick film (x = 0.0325) showed a PC-O structure owing to the diffusion of the NN templates into the thick film. The textured thick film (x = 0.0375) exhibited an increased d(33) of 625 pC/N because of the PC-T-O multi-structure and the lineup of grains along the [001] direction. A textured thick film (x = 0.0375) was used to fabricate a planar-type actuator to confirm its applicability to electrical devices. This actuator exhibits large acceleration (580.3 G) and displacement (150 mu m) at a low electric field of 0.2 kV/mm with a short response time of 3.0 ms. Therefore, the (N0.5-xLxK)(NS)-CZ thick films are excellent lead-free piezoceramics.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherWILEY-
dc.subjectPHASE-BOUNDARY STRUCTURES-
dc.subjectTEMPLATED GRAIN-GROWTH-
dc.subjectLEAD-FREE CERAMICS-
dc.subjectELECTRICAL-PROPERTIES-
dc.subjectSTRAIN-
dc.subjectANTIMONY-
dc.subjectNA-
dc.titleStructural and piezoelectric properties of textured NLKNS-CZ thick films and their application in planar piezoactuator-
dc.typeArticle-
dc.contributor.affiliatedAuthorNahm, Sahn-
dc.identifier.doi10.1111/jace.18156-
dc.identifier.scopusid2-s2.0-85117882837-
dc.identifier.wosid000712025200001-
dc.identifier.bibliographicCitationJOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.105, no.2, pp.1185 - 1197-
dc.relation.isPartOfJOURNAL OF THE AMERICAN CERAMIC SOCIETY-
dc.citation.titleJOURNAL OF THE AMERICAN CERAMIC SOCIETY-
dc.citation.volume105-
dc.citation.number2-
dc.citation.startPage1185-
dc.citation.endPage1197-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryMaterials Science, Ceramics-
dc.subject.keywordPlusPHASE-BOUNDARY STRUCTURES-
dc.subject.keywordPlusTEMPLATED GRAIN-GROWTH-
dc.subject.keywordPlusLEAD-FREE CERAMICS-
dc.subject.keywordPlusELECTRICAL-PROPERTIES-
dc.subject.keywordPlusSTRAIN-
dc.subject.keywordPlusANTIMONY-
dc.subject.keywordPlusNA-
dc.subject.keywordAuthorActuator-
dc.subject.keywordAuthorNKN-
dc.subject.keywordAuthorPiezoelectric-
dc.subject.keywordAuthorTextured Ceramic-
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