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Remarkable piezoelectric performance and good thermal stability of < 001 > -textured 0.96(K0.5Na0.5)(Nb1-ySby)O-3-0.04SrZrO(3) lead-free piezoelectric ceramics

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dc.contributor.authorKim, Dae-Su-
dc.contributor.authorEum, Jae-Min-
dc.contributor.authorGo, Su-Hwan-
dc.contributor.authorShin, Ho-Sung-
dc.contributor.authorKim, Hero-
dc.contributor.authorChae, Seok-June-
dc.contributor.authorKim, Sun-Woo-
dc.contributor.authorKim, Eun-Ji-
dc.contributor.authorWoo, Jong-Un-
dc.contributor.authorNahm, Sahn-
dc.date.accessioned2022-02-14T07:41:18Z-
dc.date.available2022-02-14T07:41:18Z-
dc.date.created2022-02-09-
dc.date.issued2021-11-15-
dc.identifier.issn0925-8388-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/135719-
dc.description.abstractA 0.96(K0.5Na0.5)(Nb1-ySby)O-3-0.04SrZrO(3) [KN(N1-ySy)-SZ] thick films with 0.045 &lt;= y &lt;= 0.08 were textured along the [001] direction using NaNbO3 (NN) templates. A 3.0 mol% NN seed-added KN(N1-ySy)-SZ thick film with y = 0.055 exhibited a large Lotgering factor of 97% and d(33) value of 502 pC/N. This thick film had an orthorhombic-pseudocubic polymorphic phase transition structure. Rietveld analysis revealed that the pseudocubic structure was similar to the R3m rhombohedral structure. The proportion of the pseudocubic phase in this thick film was significantly lower than that of the orthorhombic phase. The proportion of the pseudocubic phase increased with increasing Sb2O5. A 3.0 mol% NN seed-added KN(N0.935S0.065)-SZ thick film (y = 0.065) exhibited a large d(33) value of 620 pC/N because it had similar proportions of orthorhombic and pseudocubic structure. The large d(33) value (&gt;= 580 pC/N) was maintained up to 110 degrees C, indicating that this thick film exhibits excellent thermal stability. Furthermore, the thick films with 0.045 &lt;= y &lt;= 0.055 are expected to be good candidates for piezoelectric energy harvesters (PEHs) because they exhibited large d(33) x g(33) values (&gt;= 19.3 pm(2)/N), which represent the figure of merit of a PEH. (C) 2021 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE SA-
dc.subjectPHASE-BOUNDARY STRUCTURES-
dc.subjectFREE PIEZOCERAMICS-
dc.subjectENERGY HARVESTER-
dc.subjectCOEFFICIENT-
dc.subjectDESIGN-
dc.subjectSTRAIN-
dc.subjectGROWTH-
dc.subjectNKN-
dc.subjectNA-
dc.titleRemarkable piezoelectric performance and good thermal stability of &lt; 001 &gt; -textured 0.96(K0.5Na0.5)(Nb1-ySby)O-3-0.04SrZrO(3) lead-free piezoelectric ceramics-
dc.typeArticle-
dc.contributor.affiliatedAuthorNahm, Sahn-
dc.identifier.doi10.1016/j.jallcom.2021.160662-
dc.identifier.scopusid2-s2.0-85107810651-
dc.identifier.wosid000677629600002-
dc.identifier.bibliographicCitationJOURNAL OF ALLOYS AND COMPOUNDS, v.882-
dc.relation.isPartOfJOURNAL OF ALLOYS AND COMPOUNDS-
dc.citation.titleJOURNAL OF ALLOYS AND COMPOUNDS-
dc.citation.volume882-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.subject.keywordPlusCOEFFICIENT-
dc.subject.keywordPlusDESIGN-
dc.subject.keywordPlusENERGY HARVESTER-
dc.subject.keywordPlusFREE PIEZOCERAMICS-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusNA-
dc.subject.keywordPlusNKN-
dc.subject.keywordPlusPHASE-BOUNDARY STRUCTURES-
dc.subject.keywordPlusSTRAIN-
dc.subject.keywordAuthorLead free-
dc.subject.keywordAuthorPiezoelectric ceramic-
dc.subject.keywordAuthorReactive templated grain growth-
dc.subject.keywordAuthorTexturing-
dc.subject.keywordAuthorThick film-
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