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Thermal and Thermoelectric Properties of SAM-Based Molecular Junctions

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dc.contributor.authorPark, Sohyun-
dc.contributor.authorYoon, Hyo Jae-
dc.date.accessioned2022-02-15T01:41:30Z-
dc.date.available2022-02-15T01:41:30Z-
dc.date.created2022-01-19-
dc.date.issued2022-05-
dc.identifier.issn1944-8244-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/135805-
dc.description.abstractIn molecular thermoelectrics, the thermopower of molecular junctions is closely interlinked with their thermal properties; however, the detailed relationship between them remains uncertain. This study systematically investigates the thermal properties of self-assembled monolayer (SAM)-based molecular junctions and relates them to the thermoelectric performance of the junctions. The electrode temperatures for the bare Au-TS, Au-TS/EGaIn, and Au-TS/TPT SAM//Ga2O3/EGaIn samples placed on a hot chuck were measured under different conditions, such as air vs vacuum and the presence and absence of thermal grease, which generates a heat conduction channel from a hot chuck to gold. It was revealed that the SAM was the most efficient thermal resistor, which was responsible for the creation of a temperature differential (Delta T) across the junction; Delta T in an air atmosphere is overestimated to some extent, and air mainly contributes to large dispersions of thermovoltage (Delta V) data. While junction measurements in air were possible at low Delta T (up to 13 K), the new optimal condition, under a vacuum and with thermal grease, allowed us to examine a wide temperature range up to Delta T = 40 K and obtain a more reliable Seebeck coefficient (S, mu V/K). The value of S under the new condition was similar to 1.4 times higher than that measured in air without thermal grease. Our study shows the potential of liquid-metal-based junctions to reliably investigate heat conduction across nanometer-thick organic films and elaborates on how the thermal properties of molecular junctions affect their thermoelectric performance.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherAMER CHEMICAL SOC-
dc.subjectTRANSPORT-
dc.subjectLENGTH-
dc.subjectMETAL-
dc.subjectSINGLE-
dc.subjectCONDUCTANCE-
dc.subjectRESISTANCE-
dc.subjectCHEMISTRY-
dc.subjectCONTACT-
dc.titleThermal and Thermoelectric Properties of SAM-Based Molecular Junctions-
dc.typeArticle-
dc.contributor.affiliatedAuthorYoon, Hyo Jae-
dc.identifier.doi10.1021/acsami.1c20840-
dc.identifier.scopusid2-s2.0-85122566028-
dc.identifier.wosid000737953800001-
dc.identifier.bibliographicCitationACS APPLIED MATERIALS & INTERFACES, v.14, no.20, pp.22818 - 22825-
dc.relation.isPartOfACS APPLIED MATERIALS & INTERFACES-
dc.citation.titleACS APPLIED MATERIALS & INTERFACES-
dc.citation.volume14-
dc.citation.number20-
dc.citation.startPage22818-
dc.citation.endPage22825-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.subject.keywordPlusTRANSPORT-
dc.subject.keywordPlusLENGTH-
dc.subject.keywordPlusMETAL-
dc.subject.keywordPlusSINGLE-
dc.subject.keywordPlusCONDUCTANCE-
dc.subject.keywordPlusRESISTANCE-
dc.subject.keywordPlusCHEMISTRY-
dc.subject.keywordPlusCONTACT-
dc.subject.keywordAuthorthermoelectrics-
dc.subject.keywordAuthorliquid metal-
dc.subject.keywordAuthormolecular junctions-
dc.subject.keywordAuthorthermal conduction-
dc.subject.keywordAuthorself-assembled monolayer (SAM)-
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