Forensic Issues and Techniques to Improve Security in SSD With Flex Capacity Feature
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ahn, Na Young | - |
dc.contributor.author | Lee, Dong Hoon | - |
dc.date.accessioned | 2022-03-12T09:40:49Z | - |
dc.date.available | 2022-03-12T09:40:49Z | - |
dc.date.created | 2022-01-19 | - |
dc.date.issued | 2021 | - |
dc.identifier.issn | 2169-3536 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/138711 | - |
dc.description.abstract | Over-provisioning technology is typically introduced as a means to improve the performance of storage systems, such as databases. The over-provisioning area is both hidden and difficult for normal users to access. This paper focuses on attack models for such hidden areas. Malicious hackers use advanced over-provisioning techniques that vary capacity according to workload, and as such, our focus is on attack models that use variable over-provisioning technology. According to these attack models, it is possible to scan for invalid blocks containing original data or malware code that is hidden in the over-provisioning area. In this paper, we outline the different forensic processes performed for each memory cell type of the over-provisioning area and disclose security enhancement techniques that increase immunity to these attack models. This leads to a discussion of forensic possibilities and countermeasures for SSDs that can change the over-provisioning area. We also present information-hiding attacks and information-exposing attacks on the invalidation area of the SSD. Our research provides a good foundation upon which the performance and security of SSD-based databases can be further improved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | FLASH-MEMORY | - |
dc.title | Forensic Issues and Techniques to Improve Security in SSD With Flex Capacity Feature | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, Dong Hoon | - |
dc.identifier.doi | 10.1109/ACCESS.2021.3136483 | - |
dc.identifier.scopusid | 2-s2.0-85122100088 | - |
dc.identifier.wosid | 000733933600001 | - |
dc.identifier.bibliographicCitation | IEEE ACCESS, v.9, pp.167067 - 167075 | - |
dc.relation.isPartOf | IEEE ACCESS | - |
dc.citation.title | IEEE ACCESS | - |
dc.citation.volume | 9 | - |
dc.citation.startPage | 167067 | - |
dc.citation.endPage | 167075 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Computer Science | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Telecommunications | - |
dc.relation.journalWebOfScienceCategory | Computer Science, Information Systems | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Telecommunications | - |
dc.subject.keywordPlus | FLASH-MEMORY | - |
dc.subject.keywordAuthor | Databases | - |
dc.subject.keywordAuthor | Flash memories | - |
dc.subject.keywordAuthor | Flexible printed circuits | - |
dc.subject.keywordAuthor | Forensic | - |
dc.subject.keywordAuthor | Forensics | - |
dc.subject.keywordAuthor | Micrometers | - |
dc.subject.keywordAuthor | NAND flash memory | - |
dc.subject.keywordAuthor | Performance evaluation | - |
dc.subject.keywordAuthor | SSD | - |
dc.subject.keywordAuthor | Security | - |
dc.subject.keywordAuthor | attack model | - |
dc.subject.keywordAuthor | hidden area | - |
dc.subject.keywordAuthor | invalid block | - |
dc.subject.keywordAuthor | malware | - |
dc.subject.keywordAuthor | over-provisioning | - |
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