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Mechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film Transistor
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE Jae Woo | - |
| dc.date.accessioned | 2022-03-22T18:42:28Z | - |
| dc.date.available | 2022-03-22T18:42:28Z | - |
| dc.date.created | 2022-03-22 | - |
| dc.date.issued | 2021-08-25 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/139245 | - |
| dc.publisher | Korea Information Display | - |
| dc.title | Mechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film Transistor | - |
| dc.title.alternative | Mechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film Transistor | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | LEE Jae Woo | - |
| dc.identifier.bibliographicCitation | 22nd International Meeting on Information Display (IMID 2022) | - |
| dc.relation.isPartOf | 22nd International Meeting on Information Display (IMID 2022) | - |
| dc.relation.isPartOf | IMID Proceeding | - |
| dc.citation.title | 22nd International Meeting on Information Display (IMID 2022) | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferenceDate | 2021-08-25 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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