Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Robustification of Learning Observers to Uncertainty Identification via Time-Varying Learning Intensity

Full metadata record
DC Field Value Language
dc.contributor.authorZhang, Chengxi-
dc.contributor.authorAhn, Choon Ki-
dc.contributor.authorWu, Jin-
dc.contributor.authorHe, Wei-
dc.contributor.authorJiang, Yi-
dc.contributor.authorLiu, Ming-
dc.date.accessioned2022-04-12T07:42:02Z-
dc.date.available2022-04-12T07:42:02Z-
dc.date.created2022-04-12-
dc.date.issued2022-03-
dc.identifier.issn1549-7747-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/140098-
dc.description.abstractThis brief studies the simultaneous estimation of states and uncertainties in general continuous-time systems. In particular, we present a novel time-varying learning intensity (TLI) learning observer (LO). It has the advantage of inheriting the valuable properties of conventional LOs with a simple structure, i.e., the uncertainty estimation is achieved using simply one algebraic equation with low computational costs. The foremost difference in comparison with conventional LOs is the utilization of the TLI approach, which attenuates the overshooting response in the case of large estimation errors and obtains decent performance improvement. Simulations for constant and time-varying signals demonstrate a notable performance boost of TLI-LO.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectFAULT RECONSTRUCTION-
dc.subjectSYSTEMS-
dc.titleRobustification of Learning Observers to Uncertainty Identification via Time-Varying Learning Intensity-
dc.typeArticle-
dc.contributor.affiliatedAuthorAhn, Choon Ki-
dc.identifier.doi10.1109/TCSII.2021.3107161-
dc.identifier.scopusid2-s2.0-85113864990-
dc.identifier.wosid000770045800129-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.69, no.3, pp.1292 - 1296-
dc.relation.isPartOfIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS-
dc.citation.titleIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS-
dc.citation.volume69-
dc.citation.number3-
dc.citation.startPage1292-
dc.citation.endPage1296-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusFAULT RECONSTRUCTION-
dc.subject.keywordPlusSYSTEMS-
dc.subject.keywordAuthorEstimation-
dc.subject.keywordAuthorUncertainty-
dc.subject.keywordAuthorObservers-
dc.subject.keywordAuthorTime-varying systems-
dc.subject.keywordAuthorMathematical model-
dc.subject.keywordAuthorEstimation error-
dc.subject.keywordAuthorCircuits and systems-
dc.subject.keywordAuthorLearning observer-
dc.subject.keywordAuthortime-varying learning intensity-
dc.subject.keywordAuthoruncertainty estimation-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Ahn, Choon ki photo

Ahn, Choon ki
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE