Conductance of ultrathin Pt films
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yun, Chang-Jin | - |
dc.contributor.author | Kim, Jiho | - |
dc.contributor.author | Kim, Mingu | - |
dc.contributor.author | Kim, Dongseuk | - |
dc.contributor.author | Hwang, Chanyong | - |
dc.contributor.author | Lee, B. C. | - |
dc.contributor.author | Rhie, Kungwon | - |
dc.date.accessioned | 2022-04-12T10:41:35Z | - |
dc.date.available | 2022-04-12T10:41:35Z | - |
dc.date.created | 2022-04-12 | - |
dc.date.issued | 2022-03 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/140112 | - |
dc.description.abstract | Ultrathin Pt less than 10 nm thick is widely used in spintronic devices including spin Hall current. The transport property and underlying physics however have not been much studied for ultrathin films. Classical theories are analyzed to find that they cannot be applied to ultrathin films. Quantum mechanical size effect theory was applied to analyze Pt and Pt/CoFeB film sets. The quantum mechanical theory explained the conductance variation for both films along with roughness remarkably well. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.subject | ELECTRICAL-RESISTIVITY MODEL | - |
dc.subject | POLYCRYSTALLINE FILMS | - |
dc.subject | CONDUCTIVITY | - |
dc.subject | REFLECTION | - |
dc.subject | TRANSPORT | - |
dc.title | Conductance of ultrathin Pt films | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Rhie, Kungwon | - |
dc.identifier.doi | 10.1007/s40042-022-00417-x | - |
dc.identifier.scopusid | 2-s2.0-85124743925 | - |
dc.identifier.wosid | 000754957100002 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.80, no.5, pp.415 - 419 | - |
dc.relation.isPartOf | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 80 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 415 | - |
dc.citation.endPage | 419 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.identifier.kciid | ART002820132 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.subject.keywordPlus | ELECTRICAL-RESISTIVITY MODEL | - |
dc.subject.keywordPlus | POLYCRYSTALLINE FILMS | - |
dc.subject.keywordPlus | CONDUCTIVITY | - |
dc.subject.keywordPlus | REFLECTION | - |
dc.subject.keywordPlus | TRANSPORT | - |
dc.subject.keywordAuthor | Spin Hall effect | - |
dc.subject.keywordAuthor | Pt | - |
dc.subject.keywordAuthor | Anomalous Hall effect | - |
dc.subject.keywordAuthor | Ultra-thin film | - |
dc.subject.keywordAuthor | Roughness | - |
dc.subject.keywordAuthor | Size effect | - |
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