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Air Annealing Process for Threshold Voltage Tuning of MoTe2 FET

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dc.contributor.authorKim, Soojin-
dc.contributor.authorRoh, Yeeun-
dc.contributor.authorChoi, Younguk-
dc.contributor.authorJun, Ah Hyun-
dc.contributor.authorSeo, Hojun-
dc.contributor.authorJu, Byeong-Kwon-
dc.date.accessioned2022-05-09T09:42:40Z-
dc.date.available2022-05-09T09:42:40Z-
dc.date.created2022-05-09-
dc.date.issued2022-04-
dc.identifier.issn2076-3417-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/140819-
dc.description.abstractA stable doping technique for modifying the conduction behaviour of two-dimensional (2D) nanomaterial-based transistors is imperative for applications based on low-power complementary oxide thin-film transistors. Achieving an ambipolar feature with a controlled threshold voltage in both the p- and n-regimes is crucial for applying MoTe2-based devices as electronic devices because their native doping states are unipolar. In this study, a simple method to tune the threshold voltage of MoTe2 field-effect transistors (FETs) was investigated in order to realise an enhancement-mode MoTe2 thin-film transistor by implementing a facile method to modulate the carrier polarity based on the oxidative properties of MoTe2 FETs. Annealing in air induced a continuous p-doping effect in the devices without significant electrical degradation. Through a precise control of the duration and temperature of the post-annealing process, the tailoring technique induces hole doping, which results in a remarkable shift in transfer characteristics, thus leading to a charge neutrality point of the devices at zero gate bias. This study demonstrates the considerable potential of air heating as a reliable and economical post-processing method for precisely modifying the threshold voltage and further controlling the doping states of MoTe2-based FETs for use in logic inverters with 2D semiconductors.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherMDPI-
dc.subjectFIELD-EFFECT TRANSISTORS-
dc.subjectTRANSITION-
dc.titleAir Annealing Process for Threshold Voltage Tuning of MoTe2 FET-
dc.typeArticle-
dc.contributor.affiliatedAuthorJu, Byeong-Kwon-
dc.identifier.doi10.3390/app12083840-
dc.identifier.scopusid2-s2.0-85128844416-
dc.identifier.wosid000786301000001-
dc.identifier.bibliographicCitationAPPLIED SCIENCES-BASEL, v.12, no.8-
dc.relation.isPartOfAPPLIED SCIENCES-BASEL-
dc.citation.titleAPPLIED SCIENCES-BASEL-
dc.citation.volume12-
dc.citation.number8-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryEngineering, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusTRANSITION-
dc.subject.keywordAuthorMoTe2-
dc.subject.keywordAuthortransition metal dichalcogenides-
dc.subject.keywordAuthorfield-effect transistors-
dc.subject.keywordAuthordoping-
dc.subject.keywordAuthorthreshold voltage-
dc.subject.keywordAuthorcharge neutrality-
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