Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Analysis of the impact of power loss due to snail trails in a 95-kWp photovoltaic power system

Full metadata record
DC Field Value Language
dc.contributor.authorOh, Wonwook-
dc.contributor.authorChoi, Hoonjoo-
dc.contributor.authorKim, Donghwan-
dc.date.accessioned2022-05-17T20:42:10Z-
dc.date.available2022-05-17T20:42:10Z-
dc.date.created2022-05-17-
dc.date.issued2021-11-
dc.identifier.issn0026-2714-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/141169-
dc.description.abstractSnail trails are a prevalent degradation phenomenon observed in solar power plants. In a previous study, it was determined that snail trails affected only the appearance of solar cells, without significantly contributing to actual power loss. However, when snail trails are accompanied by solar cell cracks, power loss occurs. We analyzed the snail trails in a specific module in a 95 kW power plant that has been operational since 2015. Moreover, we evaluated the power generation loss arising from snail trails using current-voltage measurements and electroluminescence analysis.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.subjectMODULES-
dc.titleAnalysis of the impact of power loss due to snail trails in a 95-kWp photovoltaic power system-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Donghwan-
dc.identifier.doi10.1016/j.microrel.2021.114230-
dc.identifier.scopusid2-s2.0-85120922896-
dc.identifier.wosid000733419700005-
dc.identifier.bibliographicCitationMICROELECTRONICS RELIABILITY, v.126-
dc.relation.isPartOfMICROELECTRONICS RELIABILITY-
dc.citation.titleMICROELECTRONICS RELIABILITY-
dc.citation.volume126-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusMODULES-
dc.subject.keywordAuthorPV modules-
dc.subject.keywordAuthorSnail trails-
dc.subject.keywordAuthorDegradation-
dc.subject.keywordAuthorFailure-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher KIM, Dong hwan photo

KIM, Dong hwan
공과대학 (신소재공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE