Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

IIoT Malware Detection Using Edge Computing and Deep Learning for Cybersecurity in Smart Factories

Full metadata record
DC Field Value Language
dc.contributor.authorKim, Ho-myung-
dc.contributor.authorLee, Kyung-ho-
dc.date.accessioned2022-09-24T01:40:17Z-
dc.date.available2022-09-24T01:40:17Z-
dc.date.created2022-09-23-
dc.date.issued2022-08-
dc.identifier.issn2076-3417-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/143814-
dc.description.abstractThe smart factory environment has been transformed into an Industrial Internet of Things (IIoT) environment, which is an interconnected and open approach. This has made smart manufacturing plants vulnerable to cyberattacks that can directly lead to physical damage. Most cyberattacks targeting smart factories are carried out using malware. Thus, a solution that efficiently detects malware by monitoring and analyzing network traffic for malware attacks in smart factory IIoT environments is critical. However, achieving accurate real-time malware detection in such environments is difficult. To solve this problem, this study proposes an edge computing-based malware detection system that efficiently detects various cyberattacks (malware) by distributing vast amounts of smart factory IIoT traffic information to edge servers for deep learning processing. The proposed malware detection system consists of three layers (edge device, edge, and cloud layers) and utilizes four meaningful functions (model training and testing, model deployment, model inference, and training data transmission) for edge-based deep learning. In experiments conducted on the Malimg dataset, the proposed malware detection system incorporating a convolutional neural network with image visualization technology achieved an overall classification accuracy of 98.93%, precision of 98.93%, recall of 98.93%, and F1-score of 98.92%.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherMDPI-
dc.subjectATTACK DETECTION-
dc.subjectINTERNET-
dc.subjectTHINGS-
dc.subjectIOT-
dc.subjectSECURITY-
dc.subjectCLASSIFICATION-
dc.subjectNETWORKS-
dc.titleIIoT Malware Detection Using Edge Computing and Deep Learning for Cybersecurity in Smart Factories-
dc.typeArticle-
dc.contributor.affiliatedAuthorLee, Kyung-ho-
dc.identifier.doi10.3390/app12157679-
dc.identifier.scopusid2-s2.0-85136969166-
dc.identifier.wosid000839135400001-
dc.identifier.bibliographicCitationAPPLIED SCIENCES-BASEL, v.12, no.15-
dc.relation.isPartOfAPPLIED SCIENCES-BASEL-
dc.citation.titleAPPLIED SCIENCES-BASEL-
dc.citation.volume12-
dc.citation.number15-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryEngineering, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusATTACK DETECTION-
dc.subject.keywordPlusCLASSIFICATION-
dc.subject.keywordPlusINTERNET-
dc.subject.keywordPlusIOT-
dc.subject.keywordPlusNETWORKS-
dc.subject.keywordPlusSECURITY-
dc.subject.keywordPlusTHINGS-
dc.subject.keywordAuthorIIoT-
dc.subject.keywordAuthorcyberattack-
dc.subject.keywordAuthorcybersecurity-
dc.subject.keywordAuthordeep learning-
dc.subject.keywordAuthoredge computing-
dc.subject.keywordAuthormalware detection-
dc.subject.keywordAuthorsmart factory-
Files in This Item
There are no files associated with this item.
Appears in
Collections
School of Cyber Security > Department of Information Security > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Kyung Ho photo

Lee, Kyung Ho
정보보호학과
Read more

Altmetrics

Total Views & Downloads

BROWSE