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Stealth ECC: A Data-Width Aware Adaptive ECC Scheme for DRAM Error Resilience
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung Woo Chung | - |
| dc.date.accessioned | 2022-10-30T17:40:35Z | - |
| dc.date.available | 2022-10-30T17:40:35Z | - |
| dc.date.created | 2022-10-29 | - |
| dc.date.issued | 2022-03-15 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/144556 | - |
| dc.publisher | IEEE/ACM | - |
| dc.title | Stealth ECC: A Data-Width Aware Adaptive ECC Scheme for DRAM Error Resilience | - |
| dc.title.alternative | Stealth ECC: A Data-Width Aware Adaptive ECC Scheme for DRAM Error Resilience | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Sung Woo Chung | - |
| dc.identifier.bibliographicCitation | Design, Automation and Test in Europe Conference | - |
| dc.relation.isPartOf | Design, Automation and Test in Europe Conference | - |
| dc.relation.isPartOf | Design, Automation and Test in Europe Conference | - |
| dc.citation.title | Design, Automation and Test in Europe Conference | - |
| dc.citation.conferencePlace | BE | - |
| dc.citation.conferenceDate | 2022-03-14 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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