CAM과 Grad-CAM 기반의 불량 웨이퍼 Bin Map 분류 및 원인 지역 시각화 방법론

Pilsung Kang

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CAM과 Grad-CAM 기반의 불량 웨이퍼 Bin Map 분류 및 원인 지역 시각화 방법론없음

Alternative Title: 없음

Authors: Pilsung Kang

Issue Date: 5-4월-2018

Publisher: 대한산업공학회

Citation: 대한산업공학회 2018 춘계공동학술대회

URI: https://scholar.korea.ac.kr/handle/2021.sw.korea/19931

Conference Name: 대한산업공학회 2018 춘계공동학술대회

Place: KO

Conference Date: 2018-04-04

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Appears in Collections: College of Engineering > School of Industrial and Management Engineering > 2. Conference Papers

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Kang, Pil sung: 공과대학 (산업경영공학부)

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