Fully automated analysis approach for in situ electron diffractionopen access
- Authors
- Lim, Sooyeon; Park, Soohyung; Kim, Hong-Kyu; Choi, In-Chan
- Issue Date
- Aug-2024
- Publisher
- ELSEVIER
- Keywords
- Transmission electron microscopy; Selected area diffraction pattern; Computer vision; Automation; 2D materials
- Citation
- CURRENT APPLIED PHYSICS, v.64, pp 68 - 73
- Pages
- 6
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- CURRENT APPLIED PHYSICS
- Volume
- 64
- Start Page
- 68
- End Page
- 73
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/199771
- DOI
- 10.1016/j.cap.2024.05.014
- ISSN
- 1567-1739
1878-1675
- Abstract
- Despite the rapid development of the state-of-the-art in-situ/operando transmission electron microscopy technologies capable of generating a substantial volume of diffraction pattern images in a compressed time frame, the associated image interpretation apparatus remains incompletely automated. Since the analysis of the acquired data is predominantly focused on a subset of this extensive data set, there is the potential for critical information to be inadvertently omitted. Using a set of computer vision algorithms, we have developed a fully automated computational tool specifically tailored for the systematic analysis of electron diffraction patterns. Our research results demonstrate that the proposed methodology represents a viable and effective approach for the automated analysis of the substantial corpus of data collected during in-situ experimental investigations.
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Collections - College of Engineering > ETC > 1. Journal Articles

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