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Fully automated analysis approach for in situ electron diffractionopen access

Authors
Lim, SooyeonPark, SoohyungKim, Hong-KyuChoi, In-Chan
Issue Date
Aug-2024
Publisher
ELSEVIER
Keywords
Transmission electron microscopy; Selected area diffraction pattern; Computer vision; Automation; 2D materials
Citation
CURRENT APPLIED PHYSICS, v.64, pp 68 - 73
Pages
6
Indexed
SCIE
SCOPUS
KCI
Journal Title
CURRENT APPLIED PHYSICS
Volume
64
Start Page
68
End Page
73
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/199771
DOI
10.1016/j.cap.2024.05.014
ISSN
1567-1739
1878-1675
Abstract
Despite the rapid development of the state-of-the-art in-situ/operando transmission electron microscopy technologies capable of generating a substantial volume of diffraction pattern images in a compressed time frame, the associated image interpretation apparatus remains incompletely automated. Since the analysis of the acquired data is predominantly focused on a subset of this extensive data set, there is the potential for critical information to be inadvertently omitted. Using a set of computer vision algorithms, we have developed a fully automated computational tool specifically tailored for the systematic analysis of electron diffraction patterns. Our research results demonstrate that the proposed methodology represents a viable and effective approach for the automated analysis of the substantial corpus of data collected during in-situ experimental investigations.
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