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Generation of depth-selectivity for reflection phase microscopy by accumulation of interferograms

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dc.contributor.authorKim, Beop-Min-
dc.date.accessioned2021-08-28T01:46:22Z-
dc.date.available2021-08-28T01:46:22Z-
dc.date.created2021-04-22-
dc.date.issued2018-01-29-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/20374-
dc.publisherSociety of Photo-optical Instrumentation Engineers-
dc.titleGeneration of depth-selectivity for reflection phase microscopy by accumulation of interferograms-
dc.title.alternativeGeneration of depth-selectivity for reflection phase microscopy by accumulation of interferograms-
dc.typeConference-
dc.contributor.affiliatedAuthorKim, Beop-Min-
dc.identifier.bibliographicCitation2018 Photonics West-
dc.relation.isPartOf2018 Photonics West-
dc.relation.isPartOf2018 Photonics West-
dc.citation.title2018 Photonics West-
dc.citation.conferencePlaceUS-
dc.citation.conferenceDate2018-01-27-
dc.type.rimsCONF-
dc.description.journalClass1-
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