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Alignment memory of a nematic liquid crystal and thermal isotropization of the surface adsorbed layer

Nych, A. B.; Reznikov, D. Yu.; Boiko, O. P.; Nazarenko, V. G.; Pergamenshchik, V. M.; Bos, P.

ArticleIssue Date2008CitationEPL, v.81, no.1PublisherIOP PUBLISHING LTD

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Micro-Raman scattering and TEM measurements of crystallization in amorphous and nanocrystalline silicon

Lyou, Jong H.

ArticleIssue Date2012CitationAPPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, v.107, no.2, pp 503 - 508PublisherSPRINGER

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