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Wafer-Scale, Uniform Grosth of Atomically Thin 2D Semiconductors by MOCVD

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dc.contributor.authorLee, Chul-Ho-
dc.date.accessioned2021-08-28T09:50:35Z-
dc.date.available2021-08-28T09:50:35Z-
dc.date.created2021-04-22-
dc.date.issued2017-02-15-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/25291-
dc.publisherSK하이닉스-
dc.titleWafer-Scale, Uniform Grosth of Atomically Thin 2D Semiconductors by MOCVD-
dc.title.alternativeWafer-Scale, Uniform Grosth of Atomically Thin 2D Semiconductors by MOCVD-
dc.typeConference-
dc.contributor.affiliatedAuthorLee, Chul-Ho-
dc.identifier.bibliographicCitation제 24회 한국반도체학술대회 (KCS)-
dc.relation.isPartOf제 24회 한국반도체학술대회 (KCS)-
dc.relation.isPartOf제 24회 한국반도체학술대회 (KCS) 초록집-
dc.citation.title제 24회 한국반도체학술대회 (KCS)-
dc.citation.conferencePlaceKO-
dc.citation.conferenceDate2017-02-13-
dc.type.rimsCONF-
dc.description.journalClass2-
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Graduate School > KU-KIST Graduate School of Converging Science and Technology > 2. Conference Papers

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