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The Effects of Low and High temperature annealing in CdZnTe Detectors
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KIM, KIHYUN | - |
| dc.date.accessioned | 2021-08-28T11:56:37Z | - |
| dc.date.available | 2021-08-28T11:56:37Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2016-11-04 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/26543 | - |
| dc.publisher | IEEE | - |
| dc.title | The Effects of Low and High temperature annealing in CdZnTe Detectors | - |
| dc.title.alternative | The Effects of Low and High temperature annealing in CdZnTe Detectors | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | KIM, KIHYUN | - |
| dc.identifier.bibliographicCitation | 2016 IEEE NSS-MIC-RTSD conference | - |
| dc.relation.isPartOf | 2016 IEEE NSS-MIC-RTSD conference | - |
| dc.relation.isPartOf | 2016 IEEE NSS-MIC-RTSD conference abstract | - |
| dc.citation.title | 2016 IEEE NSS-MIC-RTSD conference | - |
| dc.citation.conferencePlace | FR | - |
| dc.citation.conferenceDate | 2016-10-29 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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