Kwon, Hyukmin; Mohaisen, Aziz; Woo, Jiyoung; Kim, Yongdae; Lee, Eunjo; Kim, Huy Kang
ArticleIssue Date2017CitationIEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, v.12, no.3, pp.544 - 556PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC