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Fault Detection of Manufacturing Process Based on Dynamic Time Warping and Exponential Penalty (DTWEP)Fault Detection of Manufacturing Process Based on Dynamic Time Warping and Exponential Penalty (DTWEP)
- Alternative Title
- Fault Detection of Manufacturing Process Based on Dynamic Time Warping and Exponential Penalty (DTWEP)
- Authors
- Jun-Geol Baek
- Issue Date
- 10-10월-2016
- Publisher
- KIIE
- Citation
- The 18th International Conference on Industrial Engineering (IJIE 2016)
- Conference Name
- The 18th International Conference on Industrial Engineering (IJIE 2016)
- Place
- KO
Hotel President, Seoul
- Conference Date
- 2016-10-10
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