Valid Data Acquisition for Patent Analysis
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park Sang Sung | - |
dc.date.accessioned | 2021-08-28T15:32:08Z | - |
dc.date.available | 2021-08-28T15:32:08Z | - |
dc.date.created | 2021-04-22 | - |
dc.date.issued | 2016-06-29 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/28538 | - |
dc.publisher | Korean Institute of Industrial Engineers & Korea Industrial and Systems Engineering | - |
dc.title | Valid Data Acquisition for Patent Analysis | - |
dc.title.alternative | Valid Data Acquisition for Patent Analysis | - |
dc.type | Conference | - |
dc.contributor.affiliatedAuthor | Park Sang Sung | - |
dc.identifier.bibliographicCitation | The 26th International Conference on Flexible Automation & Intelligent Manufacturing | - |
dc.relation.isPartOf | The 26th International Conference on Flexible Automation & Intelligent Manufacturing | - |
dc.relation.isPartOf | Proceedings on The 26th International Conference on Flexible Automation & Intelligent Manufacturing | - |
dc.citation.title | The 26th International Conference on Flexible Automation & Intelligent Manufacturing | - |
dc.citation.conferencePlace | KO | - |
dc.citation.conferenceDate | 2016-06-27 | - |
dc.type.rims | CONF | - |
dc.description.journalClass | 1 | - |
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