2D 배열형 CdTe 검출기를 사용한 3D FXCT 비파괴 검사법
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wonho Lee | - |
dc.date.accessioned | 2021-08-28T17:54:13Z | - |
dc.date.available | 2021-08-28T17:54:13Z | - |
dc.date.created | 2021-04-22 | - |
dc.date.issued | 2016-04-07 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/30076 | - |
dc.publisher | 대한방사선방어학회 | - |
dc.title | 2D 배열형 CdTe 검출기를 사용한 3D FXCT 비파괴 검사법 | - |
dc.title.alternative | 2D 배열형 CdTe 검출기를 사용한 3D FXCT 비파괴 검사법 | - |
dc.type | Conference | - |
dc.contributor.affiliatedAuthor | Wonho Lee | - |
dc.identifier.bibliographicCitation | 2016년도 대한방사선방어학회 춘계학술대회 | - |
dc.relation.isPartOf | 2016년도 대한방사선방어학회 춘계학술대회 | - |
dc.relation.isPartOf | 2016년도 대한방사선방어학회 춘계학술대회 | - |
dc.citation.title | 2016년도 대한방사선방어학회 춘계학술대회 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.conferenceDate | 2016-04-06 | - |
dc.type.rims | CONF | - |
dc.description.journalClass | 2 | - |
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