Solid-state quantum defects and scanning probe microscopy
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Donghun Lee | - |
dc.date.accessioned | 2021-08-28T18:28:36Z | - |
dc.date.available | 2021-08-28T18:28:36Z | - |
dc.date.created | 2021-04-22 | - |
dc.date.issued | 2016-03-10 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/30261 | - |
dc.publisher | EMN | - |
dc.title | Solid-state quantum defects and scanning probe microscopy | - |
dc.title.alternative | Solid-state quantum defects and scanning probe microscopy | - |
dc.type | Conference | - |
dc.contributor.affiliatedAuthor | Donghun Lee | - |
dc.identifier.bibliographicCitation | EMN international conference | - |
dc.relation.isPartOf | EMN international conference | - |
dc.relation.isPartOf | 초록집 | - |
dc.citation.title | EMN international conference | - |
dc.citation.conferencePlace | CH | - |
dc.citation.conferenceDate | 2016-03-08 | - |
dc.type.rims | CONF | - |
dc.description.journalClass | 1 | - |
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