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Improvement on Photo Diode Well Capacity by Removing Charge Transfer Loss in CMOS Image Sensor
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung, Man Young | - |
| dc.date.accessioned | 2021-08-29T04:33:08Z | - |
| dc.date.available | 2021-08-29T04:33:08Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2014-12-10 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/36423 | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | Improvement on Photo Diode Well Capacity by Removing Charge Transfer Loss in CMOS Image Sensor | - |
| dc.title.alternative | - | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Sung, Man Young | - |
| dc.identifier.bibliographicCitation | The 17th International Symposium on the Physics of Semiconductorsr and Applications, pp.316 | - |
| dc.relation.isPartOf | The 17th International Symposium on the Physics of Semiconductorsr and Applications | - |
| dc.relation.isPartOf | ISPSA | - |
| dc.citation.title | The 17th International Symposium on the Physics of Semiconductorsr and Applications | - |
| dc.citation.startPage | 316 | - |
| dc.citation.endPage | 316 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 대한민국 제주도 | - |
| dc.citation.conferenceDate | 2014-12-07 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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