Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Analysis of CdTe Semiconductor Detectors for 2D and 3D Non-Destructive fluorescent X-ray Computed Tomography (FXCT) Experiments
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Wonho Lee | - |
| dc.date.accessioned | 2021-08-29T05:46:08Z | - |
| dc.date.available | 2021-08-29T05:46:08Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2014-11-13 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/37132 | - |
| dc.publisher | IEEE | - |
| dc.title | Analysis of CdTe Semiconductor Detectors for 2D and 3D Non-Destructive fluorescent X-ray Computed Tomography (FXCT) Experiments | - |
| dc.title.alternative | 영문 | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Wonho Lee | - |
| dc.identifier.bibliographicCitation | IEEE 2014 Nuclear Science Sympoosium and Medical Imaging Conference | - |
| dc.relation.isPartOf | IEEE 2014 Nuclear Science Sympoosium and Medical Imaging Conference | - |
| dc.relation.isPartOf | Proceeding on IEEE 2014 Nuclear Science Sympoosium and Medical Imaging Conference | - |
| dc.citation.title | IEEE 2014 Nuclear Science Sympoosium and Medical Imaging Conference | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.conferenceDate | 2014-11-08 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.