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Analysis of Charge Transfer Loss Induced by Off-Axis Slicing in CMOS IMAGE Sensor
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung, Man Young | - |
| dc.date.accessioned | 2021-08-29T06:40:15Z | - |
| dc.date.available | 2021-08-29T06:40:15Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2014-10-30 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/37639 | - |
| dc.publisher | ICSICT | - |
| dc.title | Analysis of Charge Transfer Loss Induced by Off-Axis Slicing in CMOS IMAGE Sensor | - |
| dc.title.alternative | - | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Sung, Man Young | - |
| dc.identifier.bibliographicCitation | 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology, pp.657 - 659 | - |
| dc.relation.isPartOf | 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology | - |
| dc.relation.isPartOf | IEEE International Conference on Solid-State and Integrated Circuit Technology | - |
| dc.citation.title | 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology | - |
| dc.citation.startPage | 657 | - |
| dc.citation.endPage | 659 | - |
| dc.citation.conferencePlace | CC | - |
| dc.citation.conferencePlace | 중국 Guilin | - |
| dc.citation.conferenceDate | 2014-10-28 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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