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Automatic Mura Inspection Using the Principal Component Analysis for the TFT-LCD PanelAutomatic Mura Inspection Using the Principal Component Analysis for the TFT-LCD Panel
- Alternative Title
- Automatic Mura Inspection Using the Principal Component Analysis for the TFT-LCD Panel
- Authors
- Ko, Sungjea
- Issue Date
- 27-5월-2014
- Publisher
- IEEE
- Citation
- ICCE-TW 2014 (2014 IEEE International Conference on Consumer Electronics - Taiwan)
- Conference Name
- ICCE-TW 2014 (2014 IEEE International Conference on Consumer Electronics - Taiwan)
- Place
- CH
- Conference Date
- 2014-05-26
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Collections - College of Engineering > School of Electrical Engineering > 2. Conference Papers
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