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표면전하 측정 현미경을 이용한 은 이온 검출Ag ion detection method using Kelvin probe force microscope
- Alternative Title
- Ag ion detection method using Kelvin probe force microscope
- Authors
- PARK, Jinsung
- Issue Date
- 2-5월-2014
- Publisher
- 대한기계학회
- Citation
- 2014년도 대한기계학회 CAE 및 응용역학 부문 춘계 학술대회
- Conference Name
- 2014년도 대한기계학회 CAE 및 응용역학 부문 춘계 학술대회
- Place
- KO
- Conference Date
- 2014-04-30
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