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표면전하 측정 현미경을 이용한 은이온 검출

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dc.contributor.authorNA, Sung Soo-
dc.date.accessioned2021-08-29T11:53:08Z-
dc.date.available2021-08-29T11:53:08Z-
dc.date.created2021-04-22-
dc.date.issued2014-05-02-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/40784-
dc.publisher대한기계학회-
dc.title표면전하 측정 현미경을 이용한 은이온 검출-
dc.title.alternativeAg ion sensing method using Kelvin probe force microscopy-
dc.typeConference-
dc.contributor.affiliatedAuthorNA, Sung Soo-
dc.identifier.bibliographicCitation2014년도 대한기계학회 CAE 및 응용역학 부문 춘계학술대회, pp.69 - 70-
dc.relation.isPartOf2014년도 대한기계학회 CAE 및 응용역학 부문 춘계학술대회-
dc.relation.isPartOf2014년도 대한기계학회 CAE 및 응용역학 부문 춘계학술대회논문집-
dc.citation.title2014년도 대한기계학회 CAE 및 응용역학 부문 춘계학술대회-
dc.citation.startPage69-
dc.citation.endPage70-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlace제주도 서귀포-
dc.citation.conferenceDate2014-04-30-
dc.type.rimsCONF-
dc.description.journalClass2-
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공과대학 (기계공학부)
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