Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Measurement of Lattice Temperature at Super Junction Planar Gate IGBT Comparing with Conventional Planar Gate IGBT
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung, Man Young | - |
| dc.date.accessioned | 2021-08-29T13:31:50Z | - |
| dc.date.available | 2021-08-29T13:31:50Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2014-03-16 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/41686 | - |
| dc.publisher | DEStech Publications, Inc. | - |
| dc.title | Measurement of Lattice Temperature at Super Junction Planar Gate IGBT Comparing with Conventional Planar Gate IGBT | - |
| dc.title.alternative | - | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Sung, Man Young | - |
| dc.identifier.bibliographicCitation | 2014 International Conference on Material Science and Material Engineering | - |
| dc.relation.isPartOf | 2014 International Conference on Material Science and Material Engineering | - |
| dc.relation.isPartOf | MSME | - |
| dc.citation.title | 2014 International Conference on Material Science and Material Engineering | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | 미국 시카고 | - |
| dc.citation.conferenceDate | 2014-03-15 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > School of Electrical Engineering > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.