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디스플레이 패널상의 얼룩 불량 분류를 위한 새로운 특징 추출 방법
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ko, Sungjea | - |
| dc.date.accessioned | 2021-08-29T14:35:20Z | - |
| dc.date.available | 2021-08-29T14:35:20Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2013-11-23 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/42443 | - |
| dc.publisher | 대한전자공학회 | - |
| dc.title | 디스플레이 패널상의 얼룩 불량 분류를 위한 새로운 특징 추출 방법 | - |
| dc.title.alternative | A new feature extraction method for mura defect classification | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Ko, Sungjea | - |
| dc.identifier.bibliographicCitation | 대한전자공학회 추계학술대회 | - |
| dc.relation.isPartOf | 대한전자공학회 추계학술대회 | - |
| dc.relation.isPartOf | 대한전자공학회 추계학술대회 | - |
| dc.citation.title | 대한전자공학회 추계학술대회 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferenceDate | 2013-11-23 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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Collections - College of Engineering > School of Electrical Engineering > 2. Conference Papers
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