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SCOPUS
Self-Supervised Representation Learning for Wafer Bin Map Defect Pattern Classification
Kahng, Hyungu;
Kim, Seoung Bum
Article
Issue Date
2021
Citation
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.34, no.1, pp.74 - 86
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Kahng, Hyungu
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contrastive learning
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convolutional neural networks
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self-supervised learning
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semiconductor manufacturing
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