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SCOPUS
Self-Supervised Representation Learning for Wafer Bin Map Defect Pattern Classification
Kahng, Hyungu;
Kim, Seoung Bum
Article
Issue Date
2021
Citation
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.34, no.1, pp.74 - 86
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIE
SCOPUS
Text Embedding Augmentation Based on Retraining With Pseudo-Labeled Adversarial Embedding
open access
Kim, M.;
Kang, P.
Article
Issue Date
2022
Citation
IEEE Access, v.10, pp.8363 - 8376
Publisher
Institute of Electrical and Electronics Engineers Inc.
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Kahng, Hyungu
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Kim, M.
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Kang, Pil sung
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KIM, Seoung Bum
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contrastive learning
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convolutional neural networks
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Deep learning
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