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Rapid thermal anneal process for indium-tin-oxide electrode formed on chemically strengthened glass

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dc.contributor.authorJu, Byeongkwon-
dc.date.accessioned2021-08-29T17:45:28Z-
dc.date.available2021-08-29T17:45:28Z-
dc.date.created2021-04-22-
dc.date.issued2013-05-12-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/44309-
dc.publisherThe Electrochemical Society-
dc.titleRapid thermal anneal process for indium-tin-oxide electrode formed on chemically strengthened glass-
dc.title.alternativeRapid thermal anneal process for indium-tin-oxide electrode formed on chemically strengthened glass-
dc.typeConference-
dc.contributor.affiliatedAuthorJu, Byeongkwon-
dc.identifier.bibliographicCitation223rd ECS-
dc.relation.isPartOf223rd ECS-
dc.relation.isPartOf223rd ECS-
dc.citation.title223rd ECS-
dc.citation.conferencePlaceCN-
dc.citation.conferenceDate2013-05-12-
dc.type.rimsCONF-
dc.description.journalClass1-
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공과대학 (전기전자공학부)
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