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A Semiconductor Yields Prediction Using Stepwise Support Vector Machine

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dc.contributor.authorKIM SUNG SHICK-
dc.date.accessioned2021-08-29T23:44:07Z-
dc.date.available2021-08-29T23:44:07Z-
dc.date.created2021-04-22-
dc.date.issued2009-11-18-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/47873-
dc.publisherIEEE-
dc.titleA Semiconductor Yields Prediction Using Stepwise Support Vector Machine-
dc.typeConference-
dc.contributor.affiliatedAuthorKIM SUNG SHICK-
dc.identifier.bibliographicCitation2009 IEEE International Symposium on Assembly and Manufacturing, pp.130 - 136-
dc.relation.isPartOf2009 IEEE International Symposium on Assembly and Manufacturing-
dc.relation.isPartOfProceedings of 2009 IEEE International Symposium on Assembly and Manufacturing-
dc.citation.title2009 IEEE International Symposium on Assembly and Manufacturing-
dc.citation.startPage130-
dc.citation.endPage136-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlaceSuwon, Korea-
dc.citation.conferenceDate2009-11-17-
dc.type.rimsCONF-
dc.description.journalClass1-
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