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Condition Monitoring of Industrial Electric Machines State of the Art and Future Challenges
- Authors
- Lee, Sang Bin; Stone, Greg C.; Antonino-Daviu, Jose; Gyftakis, Konstantinos N.; Strangas, Elias G.; Maussion, Pascal; Platero, Carlos A.
- Issue Date
- 12월-2020
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Citation
- IEEE INDUSTRIAL ELECTRONICS MAGAZINE, v.14, no.4, pp.158 - 167
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE INDUSTRIAL ELECTRONICS MAGAZINE
- Volume
- 14
- Number
- 4
- Start Page
- 158
- End Page
- 167
- ISSN
- 1932-4529
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- There are no files associated with this item.
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Collections - College of Engineering > School of Electrical Engineering > 1. Journal Articles
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