Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Influence of Thermal Evaporation Substrate Revolution Velocity on Electroluminescence Characteristics of Organic Light Emitting Diodes

Authors
Kang, Shin WooChoi, JinnilJu, Byeong-KwonPark, Young Wook
Issue Date
11월-2020
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
Thermal Evaporation; Substrate Rotation Speed; OLED
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.20, no.11, pp.6688 - 6691
Indexed
SCIE
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume
20
Number
11
Start Page
6688
End Page
6691
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/51917
DOI
10.1166/jnn.2020.18771
ISSN
1533-4880
Abstract
In this work, we report the effect of the rotation speed of the deposited substrate on the electroluminescence (EL) efficiency of the organic light-emitting diode (OLED). Because it has been reported that the deposition angle velocity affects the growth of an organic thin film, it is expected that the OLED EL characteristics must be affected depending on the substrate rotation velocity. Thus, in this work, the substrate rotation velocity was altered during the deposition of each organic material. The OLED devices fabricated with different depositing substrate rotation speeds showed different EL characteristics. The film thickness of the organic materials with different substrate rotation speed was carefully controlled. It was confirmed to be the same with a surface profiler and was further field enhanced using a scanning electron microscope. The difference in peak EQE was observed to be greater than 1.5 times. Based on this result, it is possible to conclude that the speed of the rotational deposition system should affect the film characteristics and therefore should be considered an important parameter.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Ju, Byeong kwon photo

Ju, Byeong kwon
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE