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Evaluation based on performance and failure of PV system in 10 years field-aged 1 MW PV power plant

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dc.contributor.authorOh, Wonwook-
dc.contributor.authorChoi, Hoonjoo-
dc.contributor.authorSeo, Kun Won-
dc.contributor.authorKim, Daesung-
dc.contributor.authorKim, So-Yeon-
dc.contributor.authorLee, Hae-Seok-
dc.contributor.authorHwang, Heon-
dc.contributor.authorKim, Donghwan-
dc.date.accessioned2021-08-30T09:49:51Z-
dc.date.available2021-08-30T09:49:51Z-
dc.date.created2021-06-18-
dc.date.issued2020-11-
dc.identifier.issn0026-2714-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/52057-
dc.description.abstractPV (Photovoltaic) power systems have been rapidly installed and spreading worldwide in recent years. And there is a belief that the PV power plant will operate stably for more than 25 years. However, the PV modules have an unexpected failure. In this paper, we diagnosed a 10-year-old power plant using drone with infra-red (IR) camera, current-voltage (I-V) and electroluminescence (EL) measurement. The approximately 1 MW plant, consisting of two different PV modules, 200 W and 220 W, showed various failure modes. 59% PV modules failure caused an output loss, and an inverter with a serious loss is expected to degrade more than its annual degradation rate in PV strings above 40%. As a result, the power loss was quantitatively estimated to hot spot, bypass diode failure and degradation rate, and the capacity of the current PV system was evaluated at 88.3% and 93.2%.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.subjectMODULES-
dc.titleEvaluation based on performance and failure of PV system in 10 years field-aged 1 MW PV power plant-
dc.typeArticle-
dc.contributor.affiliatedAuthorLee, Hae-Seok-
dc.contributor.affiliatedAuthorKim, Donghwan-
dc.identifier.doi10.1016/j.microrel.2020.113763-
dc.identifier.scopusid2-s2.0-85088949351-
dc.identifier.wosid000593986300002-
dc.identifier.bibliographicCitationMICROELECTRONICS RELIABILITY, v.114-
dc.relation.isPartOfMICROELECTRONICS RELIABILITY-
dc.citation.titleMICROELECTRONICS RELIABILITY-
dc.citation.volume114-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusMODULES-
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