Evaluation based on performance and failure of PV system in 10 years field-aged 1 MW PV power plant
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Oh, Wonwook | - |
dc.contributor.author | Choi, Hoonjoo | - |
dc.contributor.author | Seo, Kun Won | - |
dc.contributor.author | Kim, Daesung | - |
dc.contributor.author | Kim, So-Yeon | - |
dc.contributor.author | Lee, Hae-Seok | - |
dc.contributor.author | Hwang, Heon | - |
dc.contributor.author | Kim, Donghwan | - |
dc.date.accessioned | 2021-08-30T09:49:51Z | - |
dc.date.available | 2021-08-30T09:49:51Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2020-11 | - |
dc.identifier.issn | 0026-2714 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/52057 | - |
dc.description.abstract | PV (Photovoltaic) power systems have been rapidly installed and spreading worldwide in recent years. And there is a belief that the PV power plant will operate stably for more than 25 years. However, the PV modules have an unexpected failure. In this paper, we diagnosed a 10-year-old power plant using drone with infra-red (IR) camera, current-voltage (I-V) and electroluminescence (EL) measurement. The approximately 1 MW plant, consisting of two different PV modules, 200 W and 220 W, showed various failure modes. 59% PV modules failure caused an output loss, and an inverter with a serious loss is expected to degrade more than its annual degradation rate in PV strings above 40%. As a result, the power loss was quantitatively estimated to hot spot, bypass diode failure and degradation rate, and the capacity of the current PV system was evaluated at 88.3% and 93.2%. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.subject | MODULES | - |
dc.title | Evaluation based on performance and failure of PV system in 10 years field-aged 1 MW PV power plant | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, Hae-Seok | - |
dc.contributor.affiliatedAuthor | Kim, Donghwan | - |
dc.identifier.doi | 10.1016/j.microrel.2020.113763 | - |
dc.identifier.scopusid | 2-s2.0-85088949351 | - |
dc.identifier.wosid | 000593986300002 | - |
dc.identifier.bibliographicCitation | MICROELECTRONICS RELIABILITY, v.114 | - |
dc.relation.isPartOf | MICROELECTRONICS RELIABILITY | - |
dc.citation.title | MICROELECTRONICS RELIABILITY | - |
dc.citation.volume | 114 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | MODULES | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
(02841) 서울특별시 성북구 안암로 14502-3290-1114
COPYRIGHT © 2021 Korea University. All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.