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Effects of thin elemental coatings on STS 444 and Crofer 22 APU for SOFC interconnect applications
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Huh, Joo Youl | - |
| dc.date.accessioned | 2021-08-30T22:02:37Z | - |
| dc.date.available | 2021-08-30T22:02:37Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2008-09-18 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/55396 | - |
| dc.publisher | POSTECH | - |
| dc.title | Effects of thin elemental coatings on STS 444 and Crofer 22 APU for SOFC interconnect applications | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Huh, Joo Youl | - |
| dc.identifier.bibliographicCitation | KoreaJapanChina SOFC Symposium | - |
| dc.relation.isPartOf | KoreaJapanChina SOFC Symposium | - |
| dc.citation.title | KoreaJapanChina SOFC Symposium | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | POSTECH | - |
| dc.citation.conferenceDate | 2008-09-17 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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