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Temperature dependence of optical properties of monolayer WS2 by spectroscopic ellipsometry

Authors
Hoang Tung NguyenKim, Tae JungPark, Han GyeolVan Long LeNguyen, Xuan AuKoo, DohyoungLee, Chul-HoCuong, Do DucHong, Soon CheolKim, Young Dong
Issue Date
1-5월-2020
Publisher
ELSEVIER
Keywords
Spectroscopic ellipsometry; Monolayer tungsten disulphide (WS2); Dielectric function; Exciton; Critical point; Temperature dependence
Citation
APPLIED SURFACE SCIENCE, v.511
Indexed
SCIE
SCOPUS
Journal Title
APPLIED SURFACE SCIENCE
Volume
511
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/56054
DOI
10.1016/j.apsusc.2020.145503
ISSN
0169-4332
Abstract
The complex dielectric function epsilon = epsilon(1) + i epsilon(2) of monolayer tungsten disulfide (WS2) is investigated for the energy range from 1.5 to 6.0 eV and temperatures from 41 to 300 K. Measurements were performed under ultra-high vacuum conditions to avoid degradation and overlayer contamination. Fourteen critical-point (CP) energies were observed and their origins in Brillouin-zone were identified by band structure calculations. At low temperature the A and B excitonic peaks split into four CPs, which is understood as the neutral and charged exciton states of monolayer WS2. At low temperatures the CP energies show blue shifts with enhanced structure due to the reduction of electron-phonon interaction. The temperature dependence of these data was obtained by a phenomenological expression with Bose-Einstein statistical factor.
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