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Improved Light Output of AlGaInP-Based Micro-Light Emitting Diode Using Distributed Bragg Reflector

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dc.contributor.authorLee, Sang-Youl-
dc.contributor.authorMoon, Ji Hyung-
dc.contributor.authorMoon, Yong-Tae-
dc.contributor.authorKim, Chung Song-
dc.contributor.authorPark, Sunwoo-
dc.contributor.authorOh, Jeong-Tak-
dc.contributor.authorJeong, Hwan-Hee-
dc.contributor.authorSeong, Tae-Yeon-
dc.contributor.authorAmano, Hiroshi-
dc.date.accessioned2021-08-31T04:36:17Z-
dc.date.available2021-08-31T04:36:17Z-
dc.date.created2021-06-19-
dc.date.issued2020-04-01-
dc.identifier.issn1041-1135-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/56686-
dc.description.abstractWe investigated how the performance and reliability of AlGaInP-based red (620 nm) micro-light-emitting diodes (micro-LEDs) (25 x 17 mu m(2)) were influenced by the use of n-AlInP ohmic layer and distributed Bragg reflector (DBR). The AlGaAs-based DBR showed reflectivity of 94.9% at 622 nm with a 14 nm-stopband width. The micro-LEDs with n-GaAs gave slightly lower forward voltages by 0.013 - 0.021 V than those with n-Al0.5In0.5P/n-Al0.6Ga0.4As and n-A(l0.5)In(0.5)P/DBR. However, the micro-LEDs with n-Al0.5In0.5P/n-Al0.6Ga0.4As and n-Al0.5In0.5P/DBR gave 61% and 125% higher light output power at 20 mu A compared with that with n-GaAs. It was shown that after annealing at 120 degrees C for 2,000 h, the forward voltage and the light output power at 4.7 A/cm(2) of the micro-LEDs with n-Al0.5In0.5P/DBR were degraded by 0.09% and 6.33%, respectively, with reference to those before annealing.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectOHMIC CONTACTS-
dc.subjectEFFICIENCY-
dc.subjectPERFORMANCE-
dc.subjectPROBES-
dc.subjectGAAS-
dc.titleImproved Light Output of AlGaInP-Based Micro-Light Emitting Diode Using Distributed Bragg Reflector-
dc.typeArticle-
dc.contributor.affiliatedAuthorSeong, Tae-Yeon-
dc.identifier.doi10.1109/LPT.2020.2977376-
dc.identifier.scopusid2-s2.0-85082018368-
dc.identifier.wosid000521297100011-
dc.identifier.bibliographicCitationIEEE PHOTONICS TECHNOLOGY LETTERS, v.32, no.7, pp.438 - 441-
dc.relation.isPartOfIEEE PHOTONICS TECHNOLOGY LETTERS-
dc.citation.titleIEEE PHOTONICS TECHNOLOGY LETTERS-
dc.citation.volume32-
dc.citation.number7-
dc.citation.startPage438-
dc.citation.endPage441-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusOHMIC CONTACTS-
dc.subject.keywordPlusEFFICIENCY-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusPROBES-
dc.subject.keywordPlusGAAS-
dc.subject.keywordAuthorMicro-light emitting diode-
dc.subject.keywordAuthorAlGaInP-
dc.subject.keywordAuthordistributed bragg reflector-
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