Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry
- Authors
- Bae, Kiho; Jang, Dong Young; Park, Joong Sun; Son, Ji-Won; Prinz, Fritz B.; Shim, Joon Hyung
- Issue Date
- 3월-2020
- Publisher
- KOREAN SOC PRECISION ENG
- Keywords
- Ion diffusion; Surface exchange; Isotope tracer; Stain effect; Heterostructure; Yttria-stabilized zirconia
- Citation
- INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY, v.7, no.2, pp.405 - 410
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY
- Volume
- 7
- Number
- 2
- Start Page
- 405
- End Page
- 410
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/57558
- DOI
- 10.1007/s40684-019-00169-3
- ISSN
- 2288-6206
- Abstract
- Diffusion of oxide ions along heterostructured yttria-stabilized zirconia (YSZ) epitaxially grown on single crystalline MgO (001) is investigated. Pulsed laser deposition is used for the epitaxial growth and focused ion beam was applied to open the lateral surface of the YSZ-MgO interface layers and to enable incorporation and diffusion of oxygen. The sample is annealed in O-18(2) environment to trace oxide ion transport with Al2O3 layers atop to block diffusion perpendicular to surface of the YSZ plane. Time-of-flight secondary mass ion spectrometry (TOF-SIMS) analyze the planar diffusion profiles. Diffusivity and surface exchange rate are estimated by SIMS data fitting. As a result, it is identified that both oxide ion diffusion and surface incorporation rates are significantly enhanced on surface of the heterostructured YSZ on MgO (001) compared to bulk YSZ.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > Department of Mechanical Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.