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dc.contributor.authorHan, J. -H-
dc.contributor.authorCha, J.-
dc.date.accessioned2021-08-31T14:39:08Z-
dc.date.available2021-08-31T14:39:08Z-
dc.date.created2021-06-18-
dc.date.issued2020-01-09-
dc.identifier.issn0013-5194-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/58327-
dc.languageEnglish-
dc.language.isoen-
dc.publisherINST ENGINEERING TECHNOLOGY-IET-
dc.titlesplitting image-
dc.typeArticle-
dc.contributor.affiliatedAuthorHan, J. -H-
dc.identifier.doi10.1049/el.2019.3897-
dc.identifier.wosid000505732300002-
dc.identifier.bibliographicCitationELECTRONICS LETTERS, v.56, no.1, pp.3 - 3-
dc.relation.isPartOfELECTRONICS LETTERS-
dc.citation.titleELECTRONICS LETTERS-
dc.citation.volume56-
dc.citation.number1-
dc.citation.startPage3-
dc.citation.endPage3-
dc.type.rimsART-
dc.type.docTypeEditorial Material-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
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